Scanning Electron Microscopy and X-Ray Microanalysis
| Author | : | |
| Rating | : | 4.23 (512 Votes) |
| Asin | : | 149396674X |
| Format Type | : | paperback |
| Number of Pages | : | 658 Pages |
| Publish Date | : | 2017-01-01 |
| Language | : | English |
DESCRIPTION:
Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners engineers, technicians, physical and biological scientists, clinicians, and technical managers will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. This book helps you to achieve this goal.Realigns the text with the needs of a div
A lot of very distinct images and schematic drawings make for a very interesting book and help readers who study scanning electron microscopy and X-ray microanalysis. The principal application and sample preparation given in this book are suitable for undergraduate students and technicians learning SEEM and EDS/WDS analyses. It is an excellent textbook for graduate students, and an outstanding reference for engineers, physical, and biological scientists.” (Microscopy and Microanalysis, Vol. It is clearly written well organized. This is a reference text that no SEM or EPMA laboratory should be without.” (Thomas J. Form the reviews of the third edition:“There is no other single volume that covers as much theory and practice of SEM or X-ray microanalysis as Scanning